[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - High Performance ZnO Nanowire FET with ITO Contacts
Hollister, Matthew A., Le, John D., Xiao, Guanghua, Lu, Xuekun, Kiehl, Richard A.Year:
2007
Language:
english
DOI:
10.1109/DRC.2007.4373675
File:
PDF, 2.00 MB
english, 2007