Optical impedance matching with scanning near-field optical microscopy
Gademann, A, Durkan, C, Shvets, I VVolume:
36
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/36/18/003
Date:
September, 2003
File:
PDF, 216 KB
english, 2003