Optical impedance matching with scanning near-field optical...

Optical impedance matching with scanning near-field optical microscopy

Gademann, A, Durkan, C, Shvets, I V
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Volume:
36
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/36/18/003
Date:
September, 2003
File:
PDF, 216 KB
english, 2003
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