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Effect of growth orientation and surface roughness on electron transport in silicon nanowires
Svizhenko, Alexei, Leu, Paul W., Cho, KyeongjaeVolume:
75
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.75.125417
Date:
March, 2007
File:
PDF, 872 KB
english, 2007