[IEEE 2010 IEEE 16th International On-Line Testing...

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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits

Maliuk, Dzmitry, Stratigopoulos, Haralampos-G., Makris, Yiorgos
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Year:
2010
Language:
english
DOI:
10.1109/IOLTS.2010.5560230
File:
PDF, 1.32 MB
english, 2010
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