Measurement and Analysis of Interconnect Crosstalk Due to...

IEEE Transactions on Nuclear Science 2008 / 08 Vol. 55; Iss. 4

Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology

Balasubramanian, Anupama, Amusan, Oluwole A., Bhuva, Bharat L., Reed, Robert A., Sternberg, Andrew L., Massengill, Lloyd W., McMorrow, Dale, Nation, Sarah A., Melinger, J. S.
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Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2008.2000781
Date:
August, 2008
File:
PDF, 643 KB
english, 2008
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