Atomic force microscope tip deconvolution using calibration...

Atomic force microscope tip deconvolution using calibration arrays

Markiewicz, Peter, Goh, M. Cynthia
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Volume:
66
Year:
1995
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1145549
File:
PDF, 977 KB
english, 1995
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