EM-Based Monte Carlo Analysis and Yield Prediction of...

IEEE Transactions on Microwave Theory and Techniques 2006 / 12 Vol. 54; Iss. 12

EM-Based Monte Carlo Analysis and Yield Prediction of Microwave Circuits Using Linear-Input Neural-Output Space Mapping

Rayas-Sanchez, Jos Ernesto, Gutierrez-Ayala, Vladimir
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Volume:
54
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2006.885902
Date:
December, 2006
File:
PDF, 2.30 MB
english, 2006
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