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up to 60 GPa using x-ray diffraction and Raman spectroscopy
Guennou, Mael, Bouvier, Pierre, Krikler, Benjamin, Kreisel, Jens, Haumont, Raphaël, Garbarino, GastonVolume:
82
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.82.134101
Date:
October, 2010
File:
PDF, 449 KB
english, 2010