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[IEEE 2011 10th International Workshop on Electronics, Control, Measurement and Signals (ECMS) - Liberec, Czech Republic (2011.06.1-2011.06.3)] 2011 10th International Workshop on Electronics, Control, Measurement and Signals - Test pattern compression based on pattern overlapping and broadcasting
Chloupek, Martin, Novak, OndrejYear:
2011
Language:
english
DOI:
10.1109/IWECMS.2011.5952372
File:
PDF, 213 KB
english, 2011