[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Image Quality Metrics: PSNR vs. SSIM
Hore, Alain, Ziou, DjemelYear:
2010
Language:
english
DOI:
10.1109/ICPR.2010.579
File:
PDF, 646 KB
english, 2010