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[IEEE Networks (DSN) - Chicago, IL, USA (2010.06.28-2010.07.1)] 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) - Reliable MLC NAND flash memories based on nonlinear t-error-correcting codes
Wang, Zhen, Karpovsky, Mark, Joshi, AjayYear:
2010
Language:
english
DOI:
10.1109/DSN.2010.5545014
File:
PDF, 1.05 MB
english, 2010