In situ Transmission Electron Microscopy Studies of...

Journal of Materials Research 2005 / 7 Vol. 20; Iss. 7

In situ Transmission Electron Microscopy Studies of Electric-field-induced Phenomena in Ferroelectrics

Tan, Xiaoli, He, Hui, Shang, Jian-Ku
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Volume:
20
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2005.0213
Date:
July, 2005
File:
PDF, 1.55 MB
english, 2005
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