[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - A novel hybrid method for SDD pattern grading and selection
Peng, Ke, Thibodeau, Jason, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, MohammadYear:
2010
Language:
english
DOI:
10.1109/VTS.2010.5469619
File:
PDF, 509 KB
english, 2010