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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - A TDC-based test platform for dynamic circuit aging characterization
Chen, Min, Reddy, Vijay, Carulli, John, Krishnan, Srikanth, Rentala, Vijay, Srinivasan, Venkatesh, Cao, YuYear:
2011
Language:
english
DOI:
10.1109/IRPS.2011.5784448
File:
PDF, 441 KB
english, 2011