![](/img/cover-not-exists.png)
[IEEE 2012 IEEE AUTOTESTCON - Anaheim, CA, USA (2012.09.10-2012.09.13)] 2012 IEEE AUTOTESTCON Proceedings - Prognostics of Power Electronics, methods and validation experiments
Kulkarni, Chetan S., Celaya, Jose R., Biswas, Gautam, Goebel, KaiYear:
2012
Language:
english
DOI:
10.1109/AUTEST.2012.6334578
File:
PDF, 710 KB
english, 2012