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Direct measurement of surface-state conductance by microscopic four-point probe method
Hasegawa, Shuji, Shiraki, Ichiro, Tanikawa, Takehiro, Petersen, Christian L, Hansen, Torben M, Boggild, Peter, Grey, FrancoisVolume:
14
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/14/35/309
Date:
September, 2002
File:
PDF, 786 KB
english, 2002