[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA...

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[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA (2010.09.13-2010.09.16)] 2010 IEEE AUTOTESTCON - A .NET framework for an integrated fault diagnosis and failure prognosis architecture

Chen, Chaochao, Brown, Douglas, Sconyers, Chris, Vachtsevanos, George, Zhang, Bin, Orchard, Marcos E.
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Year:
2010
Language:
english
DOI:
10.1109/AUTEST.2010.5613626
File:
PDF, 938 KB
english, 2010
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