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Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion
Vazquez, J. C., Champac, V., Semião, J., Teixeira, I. C., Santos, M. B., Teixeira, J. P.Volume:
29
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-013-5358-z
Date:
June, 2013
File:
PDF, 539 KB
english, 2013