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[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA (2010.09.13-2010.09.16)] 2010 IEEE AUTOTESTCON - Distributed diagnosis of complex systems using timed failure propagation graph models
Mahadevan, Nagabhushan, Abdelwahed, Sherif, Dubey, Abhishek, Karsai, GaborYear:
2010
Language:
english
DOI:
10.1109/AUTEST.2010.5613575
File:
PDF, 1.98 MB
english, 2010