Efficient Pattern Generation for Small-Delay Defects Using...

Journal of Electronic Testing 2013 / 02 Vol. 29; Iss. 1

Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults

Bao, Fang, Peng, Ke, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Winemberg, LeRoy, Tehranipoor, Mohammad
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Volume:
29
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-012-5345-9
Date:
February, 2013
File:
PDF, 1.03 MB
english, 2013
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