[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA...

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[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA (2010.09.13-2010.09.16)] 2010 IEEE AUTOTESTCON - Creating modular test systems

Wilhite, Bruce, Craig, Donald
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Year:
2010
DOI:
10.1109/AUTEST.2010.5613559
File:
PDF, 394 KB
2010
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