![](/img/cover-not-exists.png)
[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - An efficient method to screen resistive opens under presence of process variation
Wang, SeongmoonYear:
2011
Language:
english
DOI:
10.1109/VTS.2011.5783771
File:
PDF, 656 KB
english, 2011