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[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy ()] 2006 IEEE International Conference on IC Design and Technology - Impact of CMOS Technology Scaling on SRAM Standby Leakage Reduction techniques

Thomas, O., Belleville, M., Jacquet, F., Flatresse, P.
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Year:
2006
Language:
english
DOI:
10.1109/ICICDT.2006.220778
File:
PDF, 5.13 MB
english, 2006
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