[IEEE Electrical Performance of Electronic Packaging - San...

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[IEEE Electrical Performance of Electronic Packaging - San Jose, CA, USA (27-29 Oct. 1997)] Electrical Performance of Electronic Packaging - Generating reduced order models via PEEC for capturing skin and proximity effects

Kamon, M., Marques, N., Silveira, L.M., White, J.
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Year:
1997
Language:
english
DOI:
10.1109/EPEP.1997.634084
File:
PDF, 334 KB
english, 1997
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