[IEEE 2011 IEEE International Conference on Computer Vision (ICCV) - Barcelona, Spain (2011.11.6-2011.11.13)] 2011 International Conference on Computer Vision - Optimal landmark detection using shape models and branch and bound
Amberg, Brian, Vetter, ThomasYear:
2011
Language:
english
DOI:
10.1109/ICCV.2011.6126275
File:
PDF, 2.36 MB
english, 2011