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[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - The impact of gate insulator dielectric constant on performance of CNTFETs at different ambient temperatures
Shirazi, Shaahin G., Mirzakuchaki, SattarYear:
2011
Language:
english
DOI:
10.1109/INEC.2011.5991722
File:
PDF, 250 KB
english, 2011