[IEEE 2013 IEEE International Conference on Industrial Technology (ICIT 2013) - Cape Town (2013.2.25-2013.2.28)] 2013 IEEE International Conference on Industrial Technology (ICIT) - Statistical dependence of pixel intensities for pattern recognition
Smielik, Ievgen, Kuhnert, Klaus-DieterYear:
2013
Language:
english
DOI:
10.1109/ICIT.2013.6505840
File:
PDF, 284 KB
english, 2013