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Current and Future Challenges in Radiation Effects on CMOS Electronics
Dodd, P. E., Shaneyfelt, M. R., Schwank, J. R., Felix, J. A.Volume:
57
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2010.2042613
Date:
August, 2010
File:
PDF, 1.35 MB
english, 2010