Lattice distortion and strain relaxation in epitaxial thin...

Applied Surface Science 2013 / 8 Vol. 278

Lattice distortion and strain relaxation in epitaxial thin films of multiferroic TbMnO3 probed by X-ray diffractometry and micro-Raman spectroscopy

Hu, Y., Stender, D., Medarde, M., Lippert, T., Wokaun, A., Schneider, C.W.
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Volume:
278
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2012.10.121
Date:
August, 2013
File:
PDF, 810 KB
english, 2013
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