[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New...

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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Adaptation of Standard RT Level BIST Architectures for System Level Communication Testing

Nemati, Nastaran, Navabi, Zainalabedin
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Year:
2011
Language:
english
DOI:
10.1109/ATS.2011.103
File:
PDF, 265 KB
english, 2011
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