[IEEE 2007 IEEE/LEOS International Conference on Optical...

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[IEEE 2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics - Hualien, Taiwan (2007.08.12-2007.07.16)] 2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics - Forward-Imaging Swept Source Optical Coherence Tomography using Silicon MEMS Scanner for High-Speed 3-D Volumetric Imaging

Kumar, Karthik, Condit, Jonathan C., McElroy, Austin, Kemp, Nate J., Hoshino, Kazunori, Milner, Thomas E., Zhang, Xiaojing
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Year:
2007
Language:
english
DOI:
10.1109/OMEMS.2007.4373814
File:
PDF, 575 KB
english, 2007
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