[IEEE 2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics - Hualien, Taiwan (2007.08.12-2007.07.16)] 2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics - Forward-Imaging Swept Source Optical Coherence Tomography using Silicon MEMS Scanner for High-Speed 3-D Volumetric Imaging
Kumar, Karthik, Condit, Jonathan C., McElroy, Austin, Kemp, Nate J., Hoshino, Kazunori, Milner, Thomas E., Zhang, XiaojingYear:
2007
Language:
english
DOI:
10.1109/OMEMS.2007.4373814
File:
PDF, 575 KB
english, 2007