[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai,...

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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Circuit Topology-Based Test Pattern Generation for Small-Delay Defects

Goel, Sandeep Kumar, Chakrabarty, Krishnendu, Yilmaz, Mahmut, Peng, Ke, Tehranipoor, Mohammad
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Year:
2010
Language:
english
DOI:
10.1109/ATS.2010.59
File:
PDF, 354 KB
english, 2010
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