[IEEE 2009 IEEE International Conference on Intelligent...

  • Main
  • [IEEE 2009 IEEE International...

[IEEE 2009 IEEE International Conference on Intelligent Computing and Intelligent Systems (ICIS 2009) - Shanghai, China (2009.11.20-2009.11.22)] 2009 IEEE International Conference on Intelligent Computing and Intelligent Systems - Fault diagnosis model of power transformer based on an improved binary tree and the choice of the optimum parameters of multi-class SVM

Xiaoyun Sun,, Guoqing An,, Ping Fu,, Jianpeng Bian,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/ICICISYS.2009.5357614
File:
PDF, 957 KB
english, 2009
Conversion to is in progress
Conversion to is failed