[IEEE 2009 IEEE International Conference on Intelligent Computing and Intelligent Systems (ICIS 2009) - Shanghai, China (2009.11.20-2009.11.22)] 2009 IEEE International Conference on Intelligent Computing and Intelligent Systems - Fault diagnosis model of power transformer based on an improved binary tree and the choice of the optimum parameters of multi-class SVM
Xiaoyun Sun,, Guoqing An,, Ping Fu,, Jianpeng Bian,Year:
2009
Language:
english
DOI:
10.1109/ICICISYS.2009.5357614
File:
PDF, 957 KB
english, 2009