[IEEE 2008 2nd Electronics Systemintegration Technology...

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[IEEE 2008 2nd Electronics Systemintegration Technology Conference - Greenwich (2008.09.1-2008.09.4)] 2008 2nd Electronics Systemintegration Technology Conference - Mechanical characterisation of thin metal layers by modelling of the nanoindentation experiment

Wittler, O., Mrossko, R., Kaulfersch, E., Wunderle, B., Michel, B.
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Year:
2008
Language:
english
DOI:
10.1109/ESTC.2008.4684488
File:
PDF, 1.80 MB
english, 2008
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