![](/img/cover-not-exists.png)
[IEEE 2010 3rd IEEE International Conference on Computer Science and Information Technology (ICCSIT 2010) - Chengdu, China (2010.07.9-2010.07.11)] 2010 3rd International Conference on Computer Science and Information Technology - An approach for assessing similarity metrics used in metric-based clone detection techniques
Shawky, Doaa M., Ali, Ahmed F.Year:
2010
Language:
english
DOI:
10.1109/ICCSIT.2010.5563834
File:
PDF, 722 KB
english, 2010