Absorption edge determination of thick GaAs wafers using...

Review of Scientific Instruments 2002 Vol. 73; Iss. 4

Absorption edge determination of thick GaAs wafers using surface photovoltage spectroscopy

Sharma, T. K., Porwal, S., Kumar, R., Kumar, Shailendra
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Volume:
73
Year:
2002
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1449461
File:
PDF, 384 KB
english, 2002
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