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[IEEE 2005 International Semiconductor Conference - Sinaia, Romania (3-5 Oct. 2005)] CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005. - Electromagnetic modeling of micromachined GaN thin films for FBAR applications
Neculoiu, D., Konstantinidis, G., Mutamba, K., Takacs, A., Vasilache, D., Sydlo, C., Kostopoulos, T., Stavrinidis, A., Muller, A.Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/SMICND.2005.1558725
File:
PDF, 2.35 MB
english, 2005