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Interior segment regrowth configurational-bias algorithm for the efficient sampling and fast relaxation of coarse-grained polyethylene and polyoxyethylene melts on a high coordination lattice
Rane, Sagar S., Mattice, Wayne L.Volume:
122
Year:
2005
Language:
english
Journal:
The Journal of Chemical Physics
DOI:
10.1063/1.1940057
File:
PDF, 397 KB
english, 2005