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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects
Lin, Xijiang, Tsai, Kun-han, Wang, Chen, Kassab, Mark, Rajski, Janusz, Kobayashi, Takeo, Klingenberg, Randy, Sato, Yasuo, Hamada, Shuji, Aikyo, TakashiYear:
2006
Language:
english
DOI:
10.1109/ATS.2006.261012
File:
PDF, 249 KB
english, 2006