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[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Reliable GaN HEMTS for high frequency applications
Heying, Ben, Luo, Wen-Ben, Smorchkova, Ioulia, Din, Salah, Wojtowicz, MikeYear:
2010
Language:
english
DOI:
10.1109/MWSYM.2010.5517568
File:
PDF, 1.08 MB
english, 2010