Instabilities in Amorphous Oxide Semiconductor Thin-Film...

IEEE Transactions on Device and Materials Reliability 2010 / 12 Vol. 10; Iss. 4

Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

Conley, John F.
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2010.2069561
Date:
December, 2010
File:
PDF, 1.22 MB
english, 2010
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