Determining lifetime in silicon blocks and wafers with...

Journal of Applied Physics 2007 Vol. 102; Iss. 12

Determining lifetime in silicon blocks and wafers with accurate expressions for carrier density

Bowden, Stuart, Sinton, Ronald A.
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Volume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2818371
File:
PDF, 634 KB
english, 2007
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