[IEEE 2008 IEEE Symposium on VLSI Circuits - Honolulu, HI,...

  • Main
  • [IEEE 2008 IEEE Symposium on VLSI...

[IEEE 2008 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2008.06.18-2008.06.20)] 2008 IEEE Symposium on VLSI Circuits - Characterizing sampling aperture of clocked comparators

Jeeradit, M., Kim, J., Leibowitz, B., Nikaeen, P., Wang, V., Garlepp, B., Werner, C.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/VLSIC.2008.4585955
File:
PDF, 582 KB
english, 2008
Conversion to is in progress
Conversion to is failed