[IEEE 2009 Optical Data Storage Topical Meeting (ODS) -...

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[IEEE 2009 Optical Data Storage Topical Meeting (ODS) - Lake Buena Vista, FL, USA (2009.05.10-2009.05.13)] 2009 Optical Data Storage Topical Meeting - The optical constants of thin films calculated from reflectance and transmittance measurements

Chiang, Donyau, Chu, Cheng Hung, Chiang, Hai-Pang, Tsai, Din Ping
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Year:
2009
Language:
english
DOI:
10.1109/ODS.2009.5031741
File:
PDF, 203 KB
english, 2009
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