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[IEEE 2006 IEEE/ACM International Conference on Computer Aided Design - Double Tree Hotel, San Jose, CA,USA (2006.11.5-2006.11.9)] 2006 IEEE/ACM International Conference on Computer Aided Design - Design and CAD Challenges in 45nm CMOS and beyond
Frank, David, Puri, Ruchir, Toma, DorelYear:
2006
Language:
english
DOI:
10.1109/ICCAD.2006.320054
File:
PDF, 4.65 MB
english, 2006