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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Advantages of the FinFET architecture in SONOS and Nanocrystal memory devices
Lombardo, S., Gerardi, C., Breuil, L., Jahan, C., Perniola, L., Cina, G., Corso, D., Tripiciano, E., Ancarani, V., Iannaccone, G., Iacono, G., Bongiorno, C., Razafindramora, J., Garozzo, C., Barbera,Year:
2007
Language:
english
DOI:
10.1109/IEDM.2007.4419102
File:
PDF, 560 KB
english, 2007