Quantitative magnetic force microscopy on perpendicularly...

Journal of Applied Physics 1998 Vol. 83; Iss. 11

Quantitative magnetic force microscopy on perpendicularly magnetized samples

Hug, Hans J., Stiefel, B., van Schendel, P. J. A., Moser, A., Hofer, R., Martin, S., Güntherodt, H.-J., Porthun, Steffen, Abelmann, Leon, Lodder, J. C., Bochi, Gabriel, O’Handley, R. C.
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Volume:
83
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.367412
File:
PDF, 1.41 MB
english, 1998
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