![](/img/cover-not-exists.png)
[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - A new SBST algorithm for testing the register file of VLIW processors
Sabena, D., Reorda, M. S., Sterpone, L.Year:
2012
Language:
english
DOI:
10.1109/DATE.2012.6176506
File:
PDF, 463 KB
english, 2012