Application-Independent Testing of 3-D Field Programmable...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2014 / 02 Vol. 22; Iss. 2

Application-Independent Testing of 3-D Field Programmable Gate Array Interconnect Faults

Peng, Yen-Lin, Kwai, Ding-Ming, Chou, Yung-Fa, Wu, Cheng-Wen
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Volume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2013.2242100
Date:
February, 2014
File:
PDF, 1.46 MB
english, 2014
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