![](/img/cover-not-exists.png)
VARIUS: A Model of Process Variation and Resulting Timing Errors for Microarchitects
Sarangi, Smruti R., Greskamp, Brian, Teodorescu, Radu, Nakano, Jun, Tiwari, Abhishek, Torrellas, JosepVolume:
21
Year:
2008
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2007.913186
File:
PDF, 2.24 MB
english, 2008